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Title:
FOURIER TRANSFORM SPECTROMETER AND FOURIER TRANSFORM SPECTROMETRY
Document Type and Number:
WIPO Patent Application WO/2012/124294
Kind Code:
A1
Abstract:
In this Fourier transform spectrometer and Fourier transform spectrometry, two light paths (a first and second light path) that are formed by means of a plurality of optical elements (112, 114, 115) are provided between the entrance position of light to be measured and an interference position, and a phase difference spectrometer (11) having a phase difference between the light paths is used in a disposition state that disposes the plurality of optical elements in a manner so that the light path difference between the two light paths (first and second light path) becomes zero when supposing that each of the two light paths (first and second light path) are formed from the same medium. The Fourier transform spectrometry and Fourier transform spectrometer having such a configuration use the phase difference spectrometer (11), and so compared to interferograms resulting from interferometers provided with conventional phase compensation plates, the magnitude (level) of the amplitude thereof becomes smaller, and thus it is possible to also detect at a high resolution minute signals in the vicinity of the zero level of the interferogram even with one AD converter.

Inventors:
NAGAI YOSHIROH (JP)
KAWANO TOSHIO (JP)
Application Number:
PCT/JP2012/001554
Publication Date:
September 20, 2012
Filing Date:
March 07, 2012
Export Citation:
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Assignee:
KONICA MINOLTA SENSING INC (JP)
NAGAI YOSHIROH (JP)
KAWANO TOSHIO (JP)
International Classes:
G01J3/45
Domestic Patent References:
WO2011074452A12011-06-23
Foreign References:
JPH10142056A1998-05-29
JPH0926358A1997-01-28
JP2005521893A2005-07-21
Attorney, Agent or Firm:
KOTANI, Etsuji et al. (JP)
Etsuji Kotani (JP)
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Claims: