FOURIER TRANSFORM SPECTROMETRY WITH A MULTI-APERTURE INTERFEROMETER

Title:

FOURIER TRANSFORM SPECTROMETRY WITH A MULTI-APERTURE INTERFEROMETER

Document Type and Number:

WIPO Patent Application WO2004011963

Kind Code:

A3

Abstract:

A spectrometer (100) configured to extract spectral information from a wavefront (160c). The spectrometer includes a first collection device (115) that includes an adjustable-optical path (125) and configured to collect a first portion (160a) of a wavefront; a second collection device (120) configured to collect a second portion (160b) of the wavefront; combiner optics (140) configured to interfere the first and second portions of the wavefront at an image plane of the first and second collector devices to form interference patterns at the image plane; and a Fourier transformation module (150) configured to derive spectral information from the interference patterns.

Inventors:

KENDRICK RICHARD LEE
SMITH ERIC H

Application Number:

PCT/US2003/023285

Publication Date:

July 15, 2004

Filing Date:

July 25, 2003

Export Citation:

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Assignee:

LOCKHEED CORP (US)

International Classes:

G01B9/02; G01J3/453; (IPC1-7): G01B9/02

Foreign References:

US20020027661A1	2002-03-07
US6704112B1	2004-03-09

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