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Title:
FOURIER TRANSFORM SPECTROSCOPY METHOD, SPECTROSCOPIC DEVICE, AND SPECTROSCOPIC MEASUREMENT PROGRAM THAT IMPROVE SPECTRAL RESOLUTION AND SPECTRAL ACCURACY
Document Type and Number:
WIPO Patent Application WO/2014/034085
Kind Code:
A1
Abstract:
Provided is a Fourier transform spectroscopy method that removes restrictions on spectral resolution and spectral accuracy in Fourier transform spectroscopy for observing a cyclic repeating phenomenon, that realizes, theoretically, infinitesimal spectral resolution (infinite spectral resolving power), and that can improve spectral accuracy. After accurately and sufficiently stabilizing the repetition cycle of a phenomenon, a temporal waveform is acquired by making a repetition cycle and a time width (observation time window T) for observing the temporal waveform of a phenomenon strictly conform, and by performing a Fourier transform, acquired is a discrete separation spectrum in which the inverse number of the observation time window T is made a frequency data gap. Measurement is repeated while causing the repetition cycle to change, and the gap of the discrete separation spectrum is supplemented. Thereby, in a case of an observation target in which the existence time of a phenomenon is longer than the repetition cycle, the spectral resolution of the obtained discrete separation spectrum becomes infinitesimal (spectral resolving power is infinite) and spectral accuracy is improved.

Inventors:
YASUI TAKESHI (JP)
HASHIMOTO MAMORU (JP)
ARAKI TSUTOMU (JP)
IYONAGA YUKI (JP)
Application Number:
PCT/JP2013/005031
Publication Date:
March 06, 2014
Filing Date:
August 26, 2013
Export Citation:
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Assignee:
UNIV OSAKA (JP)
International Classes:
G01J3/45; G01N21/35; G01N24/08; G01N27/62; G01R33/32; G01R33/48; G01R33/54
Domestic Patent References:
WO2006092874A12006-09-08
Foreign References:
JP2011099752A2011-05-19
JP4565198B22010-10-20
JP2011242180A2011-12-01
Attorney, Agent or Firm:
THE PATENT CORPORATE BODY GLOBAL INTELLECTUAL PROPERTY (JP)
Patent business corporation global intellectual property (JP)
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