Title:
FREQUENCY COMPONENT MEASURING DEVICE
Document Type and Number:
WIPO Patent Application WO/2007/013302
Kind Code:
A1
Abstract:
A frequency component measuring device formed in a simple structure and enabling a reduction in measurement time and an increase in measurement accuracy. The frequency component measuring device comprises mixers (10, 20) and local transmitters (12, 22) as a plurality of frequency changing means changing the frequencies of measured signals input therein as signals to be measured and a signal processing part (40) as a signal processing means for extracting frequency components and removing images based on signals provided after the frequencies are changed by the plurality of frequency changing means.
Inventors:
KURITA HIROYUKI (JP)
Application Number:
PCT/JP2006/313834
Publication Date:
February 01, 2007
Filing Date:
July 12, 2006
Export Citation:
Assignee:
ADVANTEST CORP (JP)
KURITA HIROYUKI (JP)
KURITA HIROYUKI (JP)
International Classes:
G01R23/173
Domestic Patent References:
| WO2002029426A1 | 2002-04-11 |
Foreign References:
| JPS5868677A | 1983-04-23 |
Attorney, Agent or Firm:
AMAGAI, Masahiko (3-10 Hyakunin-cho 3-chom, Shinjuku-ku Tokyo 73, JP)
Download PDF: