Title:
FRONT-END CIRCUIT, TEST BOARD, TEST SYSTEM, COMPUTER, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2019/230382
Kind Code:
A1
Abstract:
A front-end circuit 200 is used for testing an RF signal from an RF device 102. The RF signal is generated by modulating a carrier signal having a carrier frequency fC with a wideband baseband signal. A frequency-variable oscillator 202 generates a local signal LO1 having a variable local frequency fLO1. A first frequency mixer 204 frequency-mixes the local signal LO1 and the RF signal to generate an IF signal having a frequency fC-fLO1. A first filter 206 of bandpass type filters the IF signal. The local frequency fLO1 can be selected from a plurality of frequencies f0, f1,... having a frequency interval Δf equal to or narrower than the bandwidth BW of the first filter 206.
Inventors:
ASAMI KOJI (JP)
KUDO TAKAHIRO (JP)
KUDO TAKAHIRO (JP)
Application Number:
PCT/JP2019/019190
Publication Date:
December 05, 2019
Filing Date:
May 14, 2019
Export Citation:
Assignee:
ADVANTEST CORP (JP)
International Classes:
H04B17/00; H03D7/00; H04B1/26; H04L27/26
Foreign References:
| US4896102A | 1990-01-23 | |||
| JP2008076112A | 2008-04-03 |
Attorney, Agent or Firm:
MORISHITA Sakaki (JP)
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