Title:
GAS ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/181031
Kind Code:
A1
Abstract:
This gas analysis device (1A) comprises: a light reception unit (172) for detecting information about the absorption by a gas to be analyzed of laser light (18a) irradiated from a laser light source (121a); a pressure sensor (11); a storage unit (23A); and a calculation unit (24A) for carrying out first processing in which a temperature and density corresponding to the light absorption information and a pressure value are calculated using, as a reference, a first database selected from among a plurality of databases stored in a storage unit (23A) and second processing in which a temperature and density corresponding to the light absorption information and pressure value are calculated using, as a reference, a second database selected from among the plurality of databases. The calculation unit (24A) switches from the first processing to the second processing when an event causing a change in the gas to be analyzed occurs while the calculation unit (24A) is carrying out the first processing. As a result, it is possible to provide a gas analysis device capable of accurately measuring the density and temperature of a gas to be analyzed even if there is a sudden change in temperature, density, and pressure.
Inventors:
KATO RUI (JP)
Application Number:
PCT/JP2018/038490
Publication Date:
September 26, 2019
Filing Date:
October 16, 2018
Export Citation:
Assignee:
SHIMADZU CORP (JP)
International Classes:
G01N21/39; G01D21/02
Foreign References:
| JP2001159605A | 2001-06-12 | |||
| JP2016070687A | 2016-05-09 | |||
| JP2013050403A | 2013-03-14 | |||
| JP2015227828A | 2015-12-17 | |||
| JP2013526708A | 2013-06-24 | |||
| JP2011149718A | 2011-08-04 | |||
| US7616316B1 | 2009-11-10 | |||
| US7969576B1 | 2011-06-28 | |||
| US20120136483A1 | 2012-05-31 |
Other References:
BOLSHOV M A ET AL.: "Tunable diode laser spectroscopy as a technique for combustion diagnostics", SPECTROCHIMICA ACTA PART B, vol. 106, 10 February 2015 (2015-02-10), pages 45 - 66, XP055434955, Retrieved from the Internet doi:10.1016/j.sab.2015.01.010
Attorney, Agent or Firm:
FUKAMI PATENT OFFICE, P.C. (JP)
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