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Patent Searching and Data


Title:
GAS ANALYSIS SYSTEM
Document Type and Number:
WIPO Patent Application WO/2023/162494
Kind Code:
A1
Abstract:
A gas analysis system (1) comprises: a first flow path (L1) through which sample gas that has passed through columns (41, 42) using helium gas as carrier gas flows; a second flow path (L2) through which the sample gas that has passed through columns (43, 44) using nitrogen gas as carrier gas flows; a TCD (90) that detects components of gas using the difference in thermal conductivity between the components; and a switching module (M3). The switching module (M3) is disposed between the first flow path (L1), the second flow path (L2), and the TCD (90), and is configured to be switchable between a first state in which the TCD (90) is connected to the first flow path (L1) and a second state in which the TCD (90) is connected to the second flow path (L2).

Inventors:
LU WENJIAN (JP)
SHIBAMOTO SHIGEAKI (JP)
Application Number:
PCT/JP2023/000544
Publication Date:
August 31, 2023
Filing Date:
January 12, 2023
Export Citation:
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Assignee:
SHIMADZU CORP (JP)
International Classes:
G01N30/26; G01N30/46; G01N30/66; G01N30/88
Domestic Patent References:
WO2020129136A12020-06-25
WO2013125001A12013-08-29
Foreign References:
JPH11311620A1999-11-09
JPH09505130A1997-05-20
JP2022514284A2022-02-10
Attorney, Agent or Firm:
FUKAMI PATENT OFFICE, P.C. (JP)
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