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Patent Searching and Data


Title:
GAS ANALYZING DEVICE AND METHOD
Document Type and Number:
WIPO Patent Application WO/1999/053307
Kind Code:
A1
Abstract:
A gas analyzing device and method capable of positively detecting leakage in a short time and conducting analyzing in a stable condition, continuously, safely and with accuracy, the device comprising a sample gas introduction system (1 to 5) for introducing by switching a plurality of sample gases and an analyzer (6, 10, 14) provided with a means (9) for monitoring the concentration change of a sample gas component introduced before switching.

Inventors:
NISHINA AKIRA (JP)
KIKUCHI TSUTOMU (JP)
TANAKA MAKOTO (JP)
YOSHIDA HIDETOSHI (JP)
KIMIJIMA TETSUYA (JP)
Application Number:
PCT/JP1999/001858
Publication Date:
October 21, 1999
Filing Date:
April 08, 1999
Export Citation:
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Assignee:
NIPPON OXYGEN CO LTD (JP)
NISHINA AKIRA (JP)
KIKUCHI TSUTOMU (JP)
TANAKA MAKOTO (JP)
YOSHIDA HIDETOSHI (JP)
KIMIJIMA TETSUYA (JP)
International Classes:
G01N27/62; G01N1/00; G01N1/26; G01N30/02; G01N30/04; G01N30/26; G01N30/72; G01N30/88; H01J49/04; (IPC1-7): G01N27/62; G01N30/72; G01M3/04; G01N1/00; H01J49/04
Foreign References:
JPH09184793A1997-07-15
JPH0634616A1994-02-10
Attorney, Agent or Firm:
Kido, Kazuhiko (Kajicho 1-chome Chiyoda-ku Tokyo, JP)
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