Title:
GAS ANALYZING DEVICE
Document Type and Number:
WIPO Patent Application WO/2024/019029
Kind Code:
A1
Abstract:
The present invention is provided with: a multi-reflection cell 30 into which sample gas comprising a plurality of components is introduced; a first analyzing mechanism 10 that causes first light to enter the multi-reflection cell 30, that detects the first light passed through the multi-reflection cell 30, and that analyzes the components of the sample gas according to a first principle; and a second analyzing mechanism 20 that causes second light to enter the multi-reflection cell 30, that detects the second light passed through the multi-reflection cell, and that analyzes the components of the sample gas according to a second principle, which is different from the first principle.
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Inventors:
NISHIMURA KATSUMI (JP)
NAKATANI SHIGERU (JP)
NAKATANI SHIGERU (JP)
Application Number:
PCT/JP2023/026187
Publication Date:
January 25, 2024
Filing Date:
July 18, 2023
Export Citation:
Assignee:
HORIBA LTD (JP)
International Classes:
G01J3/02; G01N21/3504; G01N21/61
Foreign References:
| CN104819958A | 2015-08-05 | |||
| JP2020112364A | 2020-07-27 | |||
| US7570360B1 | 2009-08-04 |
Attorney, Agent or Firm:
NISHIMURA, Ryuhei et al. (JP)
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