Title:
GAS BLOCK DEVICE
Document Type and Number:
WIPO Patent Application WO/2010/079758
Kind Code:
A1
Abstract:
An abnormal flow rate is determined accurately by calculating a correction flow rate from which the pulsation component is removed. A gas block device includes a flow rate detection section (21), a flow rate calculation section (22), an abnormal flow rate determination section (23), a valve drive section (24), a valve (25), a pulsation correction section (26), a pulsation holding section (27), and an external input section (28), wherein the pulsation correction section (26) extracts a pulsation pattern (F) from the flow rate (B) of the flow rate calculation section (22), and calculates a correction flow rate (E) from which the pulsation component is cancelled by adding a value which has the phase opposite to that of the pulsation pattern (F) to the flow rate (B). Consequently, a gas block device can make a comparison with an abnormality determination flow rate at the abnormal flow rate determination section (23).
Inventors:
OOTANI, Takuhisa (())
大谷卓久 (())
KOBA, Yasuo (())
木場康雄 (())
NAKAMURA, Hirozumi (())
中村廣純 (())
FUJII, Yuji (())
藤井裕史 (())
IWAMOTO, Ryuji (())
岩本龍志 (())
YOKOHATA, Mitsuo (())
大谷卓久 (())
KOBA, Yasuo (())
木場康雄 (())
NAKAMURA, Hirozumi (())
中村廣純 (())
FUJII, Yuji (())
藤井裕史 (())
IWAMOTO, Ryuji (())
岩本龍志 (())
YOKOHATA, Mitsuo (())
Application Number:
JP2010/000073
Publication Date:
July 15, 2010
Filing Date:
January 07, 2010
Export Citation:
Assignee:
Panasonic Corporation (1006, Oaza Kadoma Kadoma-sh, Osaka 01, 〒5718501, JP)
パナソニック株式会社 (〒01 大阪府門真市大字門真１００６番地 Osaka, 〒5718501, JP)
OOTANI, Takuhisa (())
大谷卓久 (())
KOBA, Yasuo (())
木場康雄 (())
NAKAMURA, Hirozumi (())
中村廣純 (())
FUJII, Yuji (())
藤井裕史 (())
IWAMOTO, Ryuji (())
岩本龍志 (())
パナソニック株式会社 (〒01 大阪府門真市大字門真１００６番地 Osaka, 〒5718501, JP)
OOTANI, Takuhisa (())
大谷卓久 (())
KOBA, Yasuo (())
木場康雄 (())
NAKAMURA, Hirozumi (())
中村廣純 (())
FUJII, Yuji (())
藤井裕史 (())
IWAMOTO, Ryuji (())
岩本龍志 (())
International Classes:
G01F3/22; G01F1/72
Attorney, Agent or Firm:
OGURI, Shohei et al. (Eikoh Patent Firm, Toranomon East Bldg. 10F 7-13, Nishi-Shimbashi 1-chome, Minato-ku,, Minato-k, Tokyo 03, 〒1050003, JP)
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