Title:
GLASS DEFECT DETECTION METHOD AND APPARATUS USING HYPERSPECTRAL IMAGING TECHNIQUE
Document Type and Number:
WIPO Patent Application WO/2016/043397
Kind Code:
A1
Abstract:
Disclosed is a glass defect detection apparatus using a hyperspectral imaging technique. The glass defect detection apparatus comprises: a hyperspectral image generation unit for generating a hyperspectral image of glass to be inspected, using an image photographing device and a spectroscope; a hyperspectral image analyzing unit for displaying each defect corresponding to a predetermined inspection item as image data, spectroscopic data, and spatial data values, using the hyperspectral image; and a fault detection unit for detecting a fault among the defects using all of the displayed image data, spectroscopic data, and spatial data values.
Inventors:
HONG JINKWANG (KR)
Application Number:
PCT/KR2015/003634
Publication Date:
March 24, 2016
Filing Date:
April 10, 2015
Export Citation:
Assignee:
HANWHA TECHWIN CO LTD (KR)
International Classes:
G01N21/88; G01N21/958; G06T7/00
Foreign References:
| KR20140016313A | 2014-02-07 | |||
| KR20120133734A | 2012-12-11 | |||
| KR20140012339A | 2014-02-03 | |||
| KR20080060041A | 2008-07-01 | |||
| US20030218743A1 | 2003-11-27 |
Attorney, Agent or Firm:
Y.P.LEE, MOCK & PARTNERS (KR)
리앤목 특허법인 (KR)
리앤목 특허법인 (KR)
Download PDF:
Previous Patent: METHOD FOR PREPARING NITROGEN-DOPED GRAPHENE AND NITROGEN-DOPED GRAPHENE PREPARED THEREBY
Next Patent: HYDRAULIC SNUBBER
Next Patent: HYDRAULIC SNUBBER