Title:
GLASS SUBSTRATE DISTORTION MEASURING METHOD AND GLASS SUBSTRATE DISTORTION MEASURING DEVICE
Document Type and Number:
WIPO Patent Application WO/2017/221825
Kind Code:
A1
Abstract:
The present invention provides a glass substrate distortion measuring method and a glass substrate distortion measuring device, whereby a glass substrate can be easily placed, and the degree of distortion of the glass substrate can be simply and quickly measured. Disclosed is a distortion measuring method for measuring, on a table 20, distortion at a discretionary position of a glass substrate G. In a placing area P on the table 20, the glass substrate G is placed on a placing board 30 that is in a tilted state, the placing board 30 in the tilted state is rotated to be in a horizontal state, the placing board 30 in the horizontal state is moved by sliding the placing board to a measuring area M on the table 20, and in the measuring area M, distortion is measured by irradiating the glass substrate G with laser light through openings 31b of the placing board 30.
Inventors:
OTA MASAHIRO (JP)
INOUE HAJIME (JP)
TAKAHASHI TADASHI (JP)
NISHIKAWA YOSHINORI (JP)
INOUE HAJIME (JP)
TAKAHASHI TADASHI (JP)
NISHIKAWA YOSHINORI (JP)
Application Number:
PCT/JP2017/022289
Publication Date:
December 28, 2017
Filing Date:
June 16, 2017
Export Citation:
Assignee:
NIPPON ELECTRIC GLASS CO (JP)
International Classes:
G01B11/16
Foreign References:
| JP2005060033A | 2005-03-10 | |||
| JP2009276088A | 2009-11-26 | |||
| JP2009216451A | 2009-09-24 | |||
| JP2014095560A | 2014-05-22 | |||
| JP2006168748A | 2006-06-29 | |||
| JP2006105747A | 2006-04-20 |
Attorney, Agent or Firm:
YANO INTERNATIONAL PATENT ATTORNEYS OFFICE, P.C. (JP)
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