Title:
HEAT ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2006/025268
Kind Code:
A1
Abstract:
Electromagnetic wave data acquisition control means (6) judges whether electromagnetic wave data matches with a trigger condition set by electromagnetic wave data acquisition trigger setting means (7) and acquires the electromagnetic wave data when they are matched. Electromagnetic wave data correlation means (10) correlates the position on the heat analysis data when a trigger is generated with the electromagnetic wave data. By using the obtained result, electromagnetic wave data identification means (14) identifies electromagnetic wave data corresponding to the position on the heat analysis data specified and outputs the electromagnetic wave data to the vicinity of the heat analysis data.
Inventors:
NAKATANI RINTARO (JP)
Application Number:
PCT/JP2005/015505
Publication Date:
March 09, 2006
Filing Date:
August 26, 2005
Export Citation:
Assignee:
SII NANOTECHNOLOGY INC (JP)
NAKATANI RINTARO (JP)
NAKATANI RINTARO (JP)
International Classes:
G01N25/20
Foreign References:
| JP2002107317A | 2002-04-10 | |||
| JP2001318068A | 2001-11-16 | |||
| JP2001183319A | 2001-07-06 | |||
| JPH09229884A | 1997-09-05 | |||
| JPH08327573A | 1996-12-13 | |||
| JP3124372B2 | 2001-01-15 |
Attorney, Agent or Firm:
Matsushita, Yoshiharu (11-2 Hiroo 1-chom, Shibuya-ku Tokyo, JP)
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