Title:
HIGH-ACCURACY INTERFERENCE WAVELENGTH MEASURING INSTRUMENT
Document Type and Number:
WIPO Patent Application WO/2022/147918
Kind Code:
A1
Abstract:
Disclosed is a high-accuracy interference wavelength measuring instrument, comprising an optical input port, a light shield, an off-axis parabolic mirror, a first flat glass, a second flat glass, at least two cylindrical lenses, and at least two linear photodetectors. An isolation frame having a hollow area at the center and having wedge angles is arranged between the first flat glass and the second flat glass so as to form a sealed cavity, and the front surface of the first flat glass and the back surface of the second flat glass are arranged opposite to each other; one side of the front surface of the first flat glass is provided with at least one small flat glass having a thickness and located in the sealed cavity, the other side of the front surface is provided with a first reflective layer, and the back surface of the second flat glass is provided with a second reflective layer. According to the high-accuracy interference wavelength measuring instrument of the present invention, in the case of not increasing the optical path size, the detected spectral range is wide, optical wavelength light of various wavelength types can be accurately measured at the same time, and the pm-level measurement accuracy is achieved.
Inventors:
CHEN LIPING (CN)
JIN BIAO (CN)
HUANG JIANJUN (CN)
HU HAIYANG (CN)
LIAN ZHE (CN)
JIN BIAO (CN)
HUANG JIANJUN (CN)
HU HAIYANG (CN)
LIAN ZHE (CN)
Application Number:
PCT/CN2021/085491
Publication Date:
July 14, 2022
Filing Date:
April 03, 2021
Export Citation:
Assignee:
STELIGHT INSTR CO LTD (CN)
International Classes:
G01J9/02; G01J9/00
Foreign References:
| CN1077530A | 1993-10-20 | |||
| CN102706462A | 2012-10-03 | |||
| US20170090064A1 | 2017-03-30 | |||
| GB2209210A | 1989-05-04 | |||
| CN203848938U | 2014-09-24 | |||
| CN111289124A | 2020-06-16 |
Attorney, Agent or Firm:
CHINA FARFIR INTELLECTUAL PROPERTY AGENCY LTD. (CN)
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