Title:
HIGH FREQUENCY MEASUREMENT METHOD AND HIGH FREQUENCY MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2018/146901
Kind Code:
A1
Abstract:
Conventional high frequency measurement methods have a problem in which variation in high frequency performance when a high frequency signal is applied to an amplifier cannot be accurately ascertained. In one aspect of a high frequency measurement method according to the present invention, a test signal (TS) is generated that is a sine wave signal having a prescribed frequency and in which a period (τ) in which the power level is a first power level and a period (T - τ) in which the power level is a second power level lower than the first power level are periodically repeated, the test signal (TS) is applied to an object of measurement (10) as an input signal, and the difference between the output signal (OUT) of the object of measurement (10) and the ideal value of the output signal (OUT) is measured.
Inventors:
MURAO YOJI (JP)
Application Number:
PCT/JP2017/041675
Publication Date:
August 16, 2018
Filing Date:
November 20, 2017
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
G01R31/26; G01R31/316; H03F3/189
Domestic Patent References:
| WO2013133170A1 | 2013-09-12 |
Foreign References:
| JPH05206744A | 1993-08-13 | |||
| JP2016057091A | 2016-04-21 | |||
| JP2017021155A | 2017-01-26 |
Other References:
See also references of EP 3581949A4
Attorney, Agent or Firm:
IEIRI Takeshi (JP)
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