Title:
HIGH MAGNETIC FIELD MEASUREMENT SYSTEM COMPRISING EXTREMELY LOW TEMPERATURE STAGE, AND METHOD FOR CONTROLLING SAME
Document Type and Number:
WIPO Patent Application WO/2014/069726
Kind Code:
A1
Abstract:
The present invention relates to a high magnetic field measurement system comprising an extremely low temperature stage and to a method for controlling the same. More particularly, the present invention relates to a system and a method for controlling same, in which the characteristics of a sample based on the location variation can be quickly and easily measured by measuring the characteristics of the sample using a high magnetic field at an extremely low temperature and in a vacuum state. Particularly, the system of the present invention may easily adjust the location and angle of a relevant sample through the manipulation from an external source at the state where the sample is placed on a measurement location under an extremely low temperature high magnetic field environment, by using a three-axis stage that only has a mechanical configuration rather than an electronic device, thus continuously measuring the characteristics of the sample based on the location variation in a short period of time. Further, various measurement results can be obtained in a short period of time, and thus load to the measurement system and to each device can be minimized, thereby improving the life of a product. Accordingly, reliability and competitiveness can be improved not only in the field of magnetic characteristic measurement device and system in an extremely low temperature high magnetic field environment but also in related or similar fields.
Inventors:
CHOI YEON SUK (KR)
KIM DONG LAK (KR)
BOG MIN GAB (KR)
JEON JONG SU (KR)
LEE JONG HYUN (KR)
KIM DONG LAK (KR)
BOG MIN GAB (KR)
JEON JONG SU (KR)
LEE JONG HYUN (KR)
Application Number:
PCT/KR2013/002159
Publication Date:
May 08, 2014
Filing Date:
March 18, 2013
Export Citation:
Assignee:
KOREA BASIC SCIENCE INST (KR)
YOONSEUL (KR)
YOONSEUL (KR)
International Classes:
G01N27/72; G01N25/00
Foreign References:
| JP2000121713A | 2000-04-28 | |||
| KR20100063327A | 2010-06-11 | |||
| KR20100045551A | 2010-05-04 | |||
| KR20120054135A | 2012-05-30 |
Attorney, Agent or Firm:
KIM, JUNG SU (KR)
김정수 (KR)
김정수 (KR)
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