HIGH-PRECISION TEMPERATURE MEASUREMENT METHOD AND SYSTEM

WIPO Patent Application WO/2023/272908

A1

A high-precision temperature measurement method and system. The high-precision temperature measurement method comprises the following steps: S1, a calibration phase, involving: performing calibration testing on a chip of a temperature sensor, and collecting output values of the temperature sensor at different calibration temperatures so as to form sampling data, wherein the sampling data includes at least two calibration arrays, and each calibration array is composed of calibration temperatures measured by a standard temperature measurement instrument and the output values of the chip of the temperature sensor; and S2, an actual measurement phase, involving: acquiring an actual output value of the chip of the temperature sensor, fitting the sampling data to obtain a temperature-output value curve, and substituting the actual output value into the temperature-output value curve to perform calculation so as to obtain an actual temperature. By means of the measurement method and the measurement system, more accurate sampling data is obtained by means of high-precision temperature calibration and collection, and the temperature-output value curve obtained by means of fitting the sampling data is closer to a true temperature curve of the chip of the temperature sensor, thereby greatly increasing the precision of temperature measurement.

XIE JIAYI (CN)
XIE SHISHI (CN)

PCT/CN2021/113614

January 05, 2023

August 19, 2021

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XIE JIAYI (CN)

G01K15/00

EP3385689A1	2018-10-10
CN102252770A	2011-11-23
CN109443601A	2019-03-08
CN106017727A	2016-10-12
CN105806513A	2016-07-27
JP2014153232A	2014-08-25

SHENZHEN KANGHONG INTELLECTUAL PROPERTY AGENT CO., LTD. (CN)

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