Title:
HIGH RESOLUTION IMAGING DEVICES WITH WIDE FIELD AND EXTENDED FOCUS
Document Type and Number:
WIPO Patent Application WO/2011/106327
Kind Code:
A3
Abstract:
Embodiments of the present invention relate to a high-resolution imaging device with wide field and extended focus comprising a beam generator for generating a plurality of nondiffracting beams and a scanning mechanism for moving the plurality of nondiffracting beams relative to the object to illuminate a volume of the object. The high-resolution imaging device also comprises surface element and a body having a light detector layer outside the surface element. The light detector layer has a light detector configured to measure light data associated with the plurality of nondiffracting beams illuminating the volume of the object. In some cases, the high-resolution imaging device also includes a lens inside of the light detector layer. The lens is configured to focus the light on the light detector surface.
Inventors:
PAVANI SRI RAMA PRASANNA (US)
YANG CHANGHUEI (US)
WU JIGANG (US)
YANG CHANGHUEI (US)
WU JIGANG (US)
Application Number:
PCT/US2011/025762
Publication Date:
December 29, 2011
Filing Date:
February 22, 2011
Export Citation:
Assignee:
CALIFORNIA INST OF TECHN (US)
PAVANI SRI RAMA PRASANNA (US)
YANG CHANGHUEI (US)
WU JIGANG (US)
PAVANI SRI RAMA PRASANNA (US)
YANG CHANGHUEI (US)
WU JIGANG (US)
International Classes:
G01B11/24; G01N21/00; H04N13/221
Domestic Patent References:
| WO2008107702A1 | 2008-09-12 |
Foreign References:
| JPH0815156A | 1996-01-19 | |||
| US20080121790A1 | 2008-05-29 | |||
| US20070207061A1 | 2007-09-06 | |||
| US20090225319A1 | 2009-09-10 |
Attorney, Agent or Firm:
MARTINEZ-LEMKE, Sheila (Suite 240San Francisco, California, US)
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