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Patent Searching and Data


Title:
HIGH-SPEED IMAGE-CAPTURING DEVICE
Document Type and Number:
WIPO Patent Application WO/2016/203667
Kind Code:
A1
Abstract:
The present invention provides a successive-image-acquiring device with a picosecond time resolution. Incident light (63) is changed into a spot, and an electron beam array (76) is generated at a photoelectric surface (72) and is narrowed to a small size with a permanent-magnetic-field lens array (67). The number of acquired images increases. Deflecting electrodes (74, 75) are produced in the free space between electron beams. The deflecting voltages become equal to or smaller than 1/100th, increasing the image acquisition rate. Deflecting-voltage transmission wires (73) serving as quasi-equidistant wires are also placed in the free space. The phase difference between the deflecting voltages in a light-receiving surface becomes so small that image distortion is negligible. A pair of the deflecting voltages are changed to sine waveforms and cosine waveforms the amplitudes of which linearly attenuate. The trajectories of the electron beams are changed into a spiral shape and cover 80% or more of a pixel area. The number of acquired images increases. Since the deflecting voltages change smoothly, an even higher rate is achieved. When the amplitude reaches the lower limit, it is returned to the first amplitude. This is repeated as one period. Successive recording in an overwriting fashion becomes possible, and when images of a subject for which light emission finishes within one period are acquired, the need for matching timing is eliminated.

Inventors:
ETOH TAKEHARU (JP)
SHIRAGA HIROYUKI (JP)
Application Number:
PCT/JP2015/081636
Publication Date:
December 22, 2016
Filing Date:
November 10, 2015
Export Citation:
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Assignee:
ETOH TAKEHARU (JP)
SHIRAGA HIROYUKI (JP)
International Classes:
H01J31/49; H01J29/68; H01J29/74; H01L27/14; H04N5/225; H04N5/369
Domestic Patent References:
WO2013129559A12013-09-06
Foreign References:
JPH06275216A1994-09-30
JP2001230322A2001-08-24
JP2001053223A2001-02-23
JPH02227945A1990-09-11
JP2001196018A2001-07-19
JPS56112060A1981-09-04
Other References:
LAGRANGE THOMAS ET AL.: "Approaches for ultrafast imaging of transient materials processes in the transmission electron microscope", MICRON, vol. 43, no. 11, November 2012 (2012-11-01), pages 1108 - 1120, XP028414550
Attorney, Agent or Firm:
SAMEJIMA, Mutsumi et al. (JP)
Mutsumi Sameshima (JP)
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