Title:
HIGH-TEMPERATURE DIELECTRIC LOSS CHARACTERISTIC MEASUREMENT SYSTEM, AND MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2021/082781
Kind Code:
A1
Abstract:
Disclosed are a high-temperature dielectric loss characteristic measurement system involving heating a material in-situ by microwaves, and a measurement method. The high-temperature dielectric loss characteristic measurement system comprises a dual directional coupler connected to a first power meter used to measure a microwave power. The first power meter measures a first incident power from a microwave generation device and a reflected power from a microwave heating cavity. The microwave heating cavity is configured to receive microwaves from the microwave generation device to heat a sample under test provided in the cavity. The microwave heating cavity comprises: a ridge waveguide arranged in the microwave heating cavity to support the sample under test; a temperature sensor measuring temperature data of the sample under test; and a second power meter measuring a second incident power from the microwave heating cavity. A processor generates, in response to power data measured by the first power meter and the second power meter, a microwave power consumed by the sample under test, and generates, according to the consumed microwave power and the temperature data, dielectric losses of the sample under test at different temperatures.
Inventors:
SHI KAIQI (CN)
WU TAO (CN)
YANG GANG (CN)
LUO XIANG (CN)
CHEN YIPEI (CN)
WU TAO (CN)
YANG GANG (CN)
LUO XIANG (CN)
CHEN YIPEI (CN)
Application Number:
PCT/CN2020/115443
Publication Date:
May 06, 2021
Filing Date:
September 16, 2020
Export Citation:
Assignee:
NINGBO NOTTINGHAM NEW MATERIALS RES INSTITUTE CO LTD (CN)
UNIV OF NOTTINGHAM NINGBO CHINA (CN)
UNIV OF NOTTINGHAM NINGBO CHINA (CN)
International Classes:
G01R27/26; G01N27/22
Foreign References:
| CN110763921A | 2020-02-07 | |||
| CN109030517A | 2018-12-18 | |||
| CN101078692A | 2007-11-28 | |||
| CN105388363A | 2016-03-09 | |||
| CN108828380A | 2018-11-16 | |||
| CN110161333A | 2019-08-23 | |||
| JP2006258451A | 2006-09-28 | |||
| US6617861B1 | 2003-09-09 |
Other References:
LI WU ET AL.: "An On-Line System for High Temperature Dielectric Property Measurement of Microwave-Assisted Sintering Materials", MATERIALS, vol. 12, no. 4, 22 February 2019 (2019-02-22), XP055809591, ISSN: 1996-1944
TAN QIAN, ZHU HUACHENG, MA WEIQUAN, YANG YANG, HUANG KAMA: "High temperature dielectric properties measurement system at 915 MHz based on deep learning", INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING, WILEY INTERSCIENCE, vol. 29, no. 11, 1 November 2019 (2019-11-01), XP055809593, ISSN: 1096-4290, DOI: 10.1002/mmce.21948
TAN QIAN, ZHU HUACHENG, MA WEIQUAN, YANG YANG, HUANG KAMA: "High temperature dielectric properties measurement system at 915 MHz based on deep learning", INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING, WILEY INTERSCIENCE, vol. 29, no. 11, 1 November 2019 (2019-11-01), XP055809593, ISSN: 1096-4290, DOI: 10.1002/mmce.21948
Attorney, Agent or Firm:
BEIJING K&Z LAW FIRM (CN)
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