Title:
IDENTIFICATION METHOD, CLASSIFICATION ANALYSIS METHOD, IDENTIFICATION DEVICE, CLASSIFICATION ANALYSIS DEVICE, AND STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2018/207524
Kind Code:
A1
Abstract:
[PROBLEM] To provide: an identification method which contributes to improvement of, for example, reliability of measurement results obtained by a tip sensing device, by appropriately identifying improper data from a set of measurement data; a classification analysis method capable of performing highly accurate classification analysis on the measurement data; an identification device; a classification analysis device; an identification storage medium; and a classification analysis storage medium. [SOLUTION] According to the present invention, a classification analysis is performed on an analyte by: obtaining in advance a feature amount indicating the feature of a waveform of a pulsed signal; setting, as learning data for machine learning, the feature amount obtained in advance; and executing a classification analysis program by using, as a variable, a feature amount that can be obtained from analysis target data from which improper data identified with high accuracy by a classifier on the basis of a PU classification method has been removed. The classification analysis can be performed on the analyte with high accuracy by using the analysis target data from which the improper data identified with high accuracy has been removed.
More Like This:
| JPS61153545 | PARTICLE ANALYZING INSTRUMENT |
| JP6742435 | Signal processing method and program |
| WO/2023/058394 | FINE PARTICLE MEASUREMENT METHOD |
Inventors:
WASHIO TAKASHI (JP)
TANIGUCHI MASATERU (JP)
OHSHIRO TAKAHITO (JP)
YOSHIDA TAKESHI (JP)
TAKAAI TAKAYUKI (JP)
TANIGUCHI MASATERU (JP)
OHSHIRO TAKAHITO (JP)
YOSHIDA TAKESHI (JP)
TAKAAI TAKAYUKI (JP)
Application Number:
PCT/JP2018/014926
Publication Date:
November 15, 2018
Filing Date:
April 09, 2018
Export Citation:
Assignee:
UNIV OSAKA (JP)
International Classes:
G01N15/14; G01N27/416; G06N99/00; G06Q10/04
Domestic Patent References:
| WO2017073737A1 | 2017-05-04 | |||
| WO2016017533A1 | 2016-02-04 | |||
| WO2014136316A1 | 2014-09-12 | |||
| WO2016053181A1 | 2016-04-07 | |||
| WO2013137209A1 | 2013-09-19 |
Foreign References:
| JP2016505836A | 2016-02-25 |
Other References:
TROSENSTEIN, J. KWANUNUA, M.MERCHANT, C. A.DRNDIC, M.SHEPARD, K L: "Integrated nanopore sensing platform with sub-microsecond temporal resolution", NATURE METHODS, 2012, pages 487 - 492, XP055181607, DOI: 10.1038/nmeth.1932
FELKAN, C.NOTO, K: "KDD '08 Proceedings of the 14th ACM SIGKDD international conference on Knowledge discovery and data mining", 2008, MACHINE LEARNING GROUP AT THE UNIVERSITY OF WAIKATO, article "Learning Classifiers from Only Positive and Unlabeled Data", pages: 213 - 220
TSUTSUI, M.TANIGUCHI, M.YOKOTA, KKAWAI, T.: "Identifying Single Nucleotides by Tunneling Current", NATURE NANOTECHNOLOGY, vol. 5, 2010, pages 286 - 290, XP055146479, DOI: 10.1038/nnano.2010.42
HASSELBLAD V.: "Estimation of parameters for a mixture of normal distributions", TECHNOMERICS, vol. 8, 1966, pages 431 - 444
See also references of EP 3623793A4
FELKAN, C.NOTO, K: "KDD '08 Proceedings of the 14th ACM SIGKDD international conference on Knowledge discovery and data mining", 2008, MACHINE LEARNING GROUP AT THE UNIVERSITY OF WAIKATO, article "Learning Classifiers from Only Positive and Unlabeled Data", pages: 213 - 220
TSUTSUI, M.TANIGUCHI, M.YOKOTA, KKAWAI, T.: "Identifying Single Nucleotides by Tunneling Current", NATURE NANOTECHNOLOGY, vol. 5, 2010, pages 286 - 290, XP055146479, DOI: 10.1038/nnano.2010.42
HASSELBLAD V.: "Estimation of parameters for a mixture of normal distributions", TECHNOMERICS, vol. 8, 1966, pages 431 - 444
See also references of EP 3623793A4
Attorney, Agent or Firm:
MIKI Hisami (JP)
Download PDF: