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Title:
III-NITRIDE ENHANCEMENT HEMT AND PREPARATION METHOD THEREFOR
Document Type and Number:
WIPO Patent Application WO/2016/141762
Kind Code:
A1
Abstract:
An III-nitride enhancement HEMT and a preparation method therefor. The preparation method comprises: forming a heterostructure, mainly consisting of a second semiconductor used as a barrier layer and a first semiconductor used as a channel layer, in a growth manner on a substrate, wherein the second semiconductor is superimposed on the first semiconductor; forming a mask layer, double as a passivation layer, on the second semiconductor; etching a grid area of the mask layer until the second semiconductor is exposed; growing a p-type layer in the grid area of the mask layer, the p-type layer and the second semiconductor forming a PN junction; and setting a p-type gate on the p-type layer, and forming an ohmic contact or a Schottky contact between the p-type gate and the p-type layer. The process of the present invention greatly alleviates the implementation difficulty of a p-type gate technology, effectively solves the reliability problem of an enhancement HEMT device and effectively inhibits a current collapse effect, thereby greatly improving the working performance of the HEMT device, and realizing a real sense of enhancement HEMT.

Inventors:
SUN QIAN (CN)
ZHOU YU (CN)
LI SHUIMING (CN)
DAI SHUJUN (CN)
GAO HONGWEI (CN)
YANG HUI (CN)
Application Number:
PCT/CN2015/099170
Publication Date:
September 15, 2016
Filing Date:
December 28, 2015
Export Citation:
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Assignee:
SUZHOU INST NANO TECH & NANO BIONICS CAS (CN)
International Classes:
H01L21/335; H01L21/28; H01L29/423; H01L29/778
Foreign References:
CN102683394A2012-09-19
CN102487080A2012-06-06
US20140159048A12014-06-12
US20130153921A12013-06-20
US20130087803A12013-04-11
Attorney, Agent or Firm:
NANJING LI&FENG INTELLECTUAL PROPERTY AGENCY (SPECIAL GENERAL PARTNERSHIP) (CN)
南京利丰知识产权代理事务所(特殊普通合伙) (CN)
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