Title:
ILLUMINANT ESTIMATION METHOD AND APPARATUS FOR ELECTRONIC DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/139411
Kind Code:
A1
Abstract:
Disclosed is an illuminant estimation method for an electronic device. The method comprises: acquiring two frames of images, the distance between which is greater than a set distance; detecting shadows of the two frames of images, extracting pixel feature points of the shadows, determining point cloud information of the shadows, and distinguishing point clouds of the different shadows according to the point cloud information of the shadows; acquiring point cloud information of the multiple objects, and distinguishing point clouds of the different objects according to the point cloud information of the multiple objects; matching the point clouds of the different shadows and the point clouds of the different objects to determine shadows corresponding to the different objects; and determining the position of the illuminant according to a positional relation between the objects and the corresponding shadows.
Inventors:
HAO DONGNING (CN)
SHEN GUOTAO (CN)
ZHU XIAOLI (CN)
HUANG QIANG (CN)
WU LONGHAI (CN)
CHEN JIE (CN)
SHEN GUOTAO (CN)
ZHU XIAOLI (CN)
HUANG QIANG (CN)
WU LONGHAI (CN)
CHEN JIE (CN)
Application Number:
PCT/KR2021/019510
Publication Date:
June 30, 2022
Filing Date:
December 21, 2021
Export Citation:
Assignee:
SAMSUNG ELECTRONICS CO LTD (KR)
International Classes:
G06V10/75; G06T7/13; G06T7/30; G06T7/73; G06V10/40
Foreign References:
| US20140341464A1 | 2014-11-20 | |||
| JP2020123823A | 2020-08-13 | |||
| US20180315235A1 | 2018-11-01 | |||
| EP3540697A1 | 2019-09-18 | |||
| US20160292889A1 | 2016-10-06 |
Attorney, Agent or Firm:
Y.P.LEE, MOCK & PARTNERS (KR)
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