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Patent Searching and Data


Title:
ILLUMINATION DEVICE AND REFLECTION-CHARACTERISTICS MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2014/192554
Kind Code:
A1
Abstract:
This invention provides an illumination device whereby an index that appropriately takes into account the intensity of a light beam guided to an object being illuminated can be obtained. Said illumination device is provided with a light source, a photodetector, and a support structure. The light source, which emits light, has either an intensity distribution in which a reference axis is an axis of symmetry or an intensity distribution in which a plane containing said reference axis is a plane of symmetry. The support structure supports the light source and the photodetector such that said light source and photodetector are positioned and oriented such that a first light beam that is part of the abovementioned light is guided to the object being illuminated and a second light beam that is part of said light is guided to the photodetector. The photodetector detects the intensity of the second light beam. The direction in which the first light beam travels makes a first angle with the abovementioned reference axis, the direction in which the second light beam travels makes a second angle with said reference axis, and said second angle is congruent to the first angle.

Inventors:
IIDA SHINICHI (JP)
YAMAGUCHI WATARU (JP)
Application Number:
PCT/JP2014/062962
Publication Date:
December 04, 2014
Filing Date:
May 15, 2014
Export Citation:
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Assignee:
KONICA MINOLTA INC (JP)
International Classes:
G01J3/10; G01J3/50
Foreign References:
JP2009222607A2009-10-01
JP2004170325A2004-06-17
JP2002214126A2002-07-31
JPH05322658A1993-12-07
JPH02201250A1990-08-09
JPH01296591A1989-11-29
JP2002214126A2002-07-31
Other References:
See also references of EP 3006910A4
Attorney, Agent or Firm:
YOSHITAKE Hidetoshi et al. (JP)
Hidetoshi Yoshitake (JP)
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