Title:
ILLUMINATION SYSTEM FOR MATERIAL INSPECTION
Document Type and Number:
WIPO Patent Application WO2005072265
Kind Code:
A3
Abstract:
An illumination system (12) for a web inspection process is provided. The illumination system (12) cooperates with a camera system (14) to detect defects in the web material (10), with the camera (14) having a line senors (35). The illumination system (12) has a single light source and a lens that arranges the light into a set of light beams. Each beam is projected to an associated small portion of the web (10), so that together, the light beams illumiate an inspection line (18) on the web (10). After the beams have been projected onto the web (10), light from each individual web portion is received by one sensor (35) in the camera (14). Depending on the camera (14) and light configuration, the light may be either refracted through or reflected from the web (10). If a defect is present in one small portion. then some of the light beam associated with that portion will follow a different path than when no defect is present, and will not be received at the sensor (35). In this way, the amount of light information received at one sensor (35)changes when a defect is in that sensor's associated small portion, exposing the defect in that small portion.
Inventors:
KIRALY CHRISTOPHER M (US)
Application Number:
PCT/US2005/002001
Publication Date:
November 24, 2005
Filing Date:
January 21, 2005
Export Citation:
Assignee:
WINTRISS ENGINEERING CORP (US)
KIRALY CHRISTOPHER M (US)
KIRALY CHRISTOPHER M (US)
International Classes:
G01N21/84; G01N21/89; G01N21/896; (IPC1-7): G01N21/84
Foreign References:
| US4709157A | 1987-11-24 | |||
| US4938601A | 1990-07-03 | |||
| US5047652A | 1991-09-10 | |||
| US5047640A | 1991-09-10 |
Other References:
See also references of EP 1718954A4
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