Title:
IMAGE ANALYSIS DEVICE, IMAGE ANALYSIS METHOD AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2020/050296
Kind Code:
A1
Abstract:
This image analysis device is characterized by comprising: an imaging unit that images a subject; a light emitting unit that emits light towards the subject; a sensor unit that detects the inclination of the imaging unit with respect to the subject; a control unit that, while controlling the light emission of the light emitting unit, causes the imaging unit to capture an image of the subject; and a specifying unit that, on the basis of said inclination and said positional relationship between the imaging unit and the light emitting unit, specifies, in the image, a measurement region separated by a prescribed distance from a reflection region that corresponds to the position where light from the light emitting unit is specularly reflected on the subject.
Inventors:
MASUDA YUJI (JP)
SEKINO MEGUMI (JP)
YOSHIKAWA HIRONOBU (JP)
BERENDS DAVID CHRISTOPHER (US)
ISNARDI MICHAEL ANTHONY (US)
ZHANG YUZHENG (US)
SEKINO MEGUMI (JP)
YOSHIKAWA HIRONOBU (JP)
BERENDS DAVID CHRISTOPHER (US)
ISNARDI MICHAEL ANTHONY (US)
ZHANG YUZHENG (US)
Application Number:
PCT/JP2019/034708
Publication Date:
March 12, 2020
Filing Date:
September 04, 2019
Export Citation:
Assignee:
SHISEIDO CO LTD (JP)
International Classes:
A61B5/00; G06V10/141; G01J3/51; H04N9/07; G06V10/56; H04N1/60
Foreign References:
| JPH06109441A | 1994-04-19 | |||
| JP2018045464A | 2018-03-22 |
Attorney, Agent or Firm:
OKABE Yuzuru et al. (JP)
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