IMAGE ANALYSIS DEVICE, METHOD, AND PROGRAM

Title:

IMAGE ANALYSIS DEVICE, METHOD, AND PROGRAM

Document Type and Number:

WIPO Patent Application WO/2020/241142

Kind Code:

A1

Abstract:

The present invention improves decision accuracy when deciding on each particle included in an image of an object. An image analysis device according to an embodiment of the present invention includes: a shape decision unit which decides on the shape of each particle in a particle image that is extracted from an image of an object, and acquires an OK particle image of an OK particle that satisfies a criterion for a prescribed shape and a provisional NG particle image of a provisional NG particle that does not satisfy the criterion; a pseudo image generation unit which generates a pseudo image by overlapping a plurality of particle images including the OK particle image; a similarity and dissimilarity determination unit which determines whether the provisional NG particle image is similar to the pseudo image, and when the provisional NG particle image is determined as similar to the pseudo image, determines that the provisional NG particle includes the OK particle.

Inventors:

OKUNO YOSHISHIGE (JP)
TAKEDA ERIKO (JP)
SHIBUYA JUNICHI (JP)
NAKAO YUKI (JP)
OGAWA KENJI (JP)

Application Number:

PCT/JP2020/017799

Publication Date:

December 03, 2020

Filing Date:

April 24, 2020

Export Citation:

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Assignee:

SHOWA DENKO KK (JP)
BLUE TAG CO LTD (JP)

International Classes:

G01N15/00; G06T7/00

Domestic Patent References:

WO2017051327A1

2017-03-30

Foreign References:

JPS6052741A	1985-03-26
US20190096056A1	2019-03-28
JP2010117175A	2010-05-27
JPH0735696A	1995-02-07

Attorney, Agent or Firm:

ITOH, Tadashige et al. (JP)

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