Title:
IMAGE ANALYSIS DEVICE, IMAGE ANALYSIS METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2021/039231
Kind Code:
A1
Abstract:
An image analysis device 100 is provided with a first detector that detects a first area in a captured image, the first area indicating an object partially shielded by a shield, a second detector that detects a second area in a captured image, the second area indicating an object that is not shielded by a shield, and an analysis unit that identifies an object area in a captured image, the object area indicating an area containing an object. The analysis unit, upon determining that the first area has been detected by the first detector and that the second area has been detected by the second detector, identifies an area that encompasses the first area and the second area as the object area.
Inventors:
AIZAWA TOMOYOSHI (JP)
Application Number:
PCT/JP2020/028671
Publication Date:
March 04, 2021
Filing Date:
July 27, 2020
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G06T7/00
Foreign References:
| JP2018151919A | 2018-09-27 | |||
| JP2009217607A | 2009-09-24 | |||
| JP2013196034A | 2013-09-30 |
Attorney, Agent or Firm:
YAMAO, Norihito et al. (JP)
Download PDF: