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Patent Searching and Data


Title:
IMAGE ANALYSIS DEVICE AND METHOD
Document Type and Number:
WIPO Patent Application WO/2020/222555
Kind Code:
A1
Abstract:
Provided is an image analysis device and method based on a sensitivity level of an image. An image analysis device of the present disclosure comprises: an image reception unit for receiving an image to be analyzed; an object image extraction unit for extracting an object included in the image to be analyzed, and configuring an object image including the object; an object characteristic identification unit for acquiring color information of the object image and identifying a characteristic of the object image on the basis of the color information; a sensitivity determination unit for identifying sensitivity information of the object image by using a sensitivity classification learning model for classification of a sensitivity level of the object image; and an image analysis unit for controlling an accuracy level of an area in which the object image exists, on the basis of the sensitivity information of the object image, and outputting a result obtained by analyzing the image to be analyzed, according to the accuracy level.

Inventors:
KIM WON TAE (KR)
KANG SHIN UK (KR)
LEE MYUNG JAE (KR)
KIM DONG MIN (KR)
SONG WOO HYUCK (KR)
Application Number:
PCT/KR2020/005745
Publication Date:
November 05, 2020
Filing Date:
April 29, 2020
Export Citation:
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Assignee:
JLK INC (KR)
International Classes:
G06T7/11; G06K9/62; G06T5/50; G06T7/90
Foreign References:
KR101825689B12018-02-05
KR101969022B12019-04-15
KR20180082904A2018-07-19
KR20180119013A2018-11-01
US20080159626A12008-07-03
KR102048948B12020-01-08
Attorney, Agent or Firm:
SUNG, Byung Kee (KR)
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