Title:
IMAGE ANALYSIS DEVICE AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2015/046530
Kind Code:
A1
Abstract:
[Problem] To propose an image analysis device and program that can quickly and accurately extract voids from a 3D image of a CMC. [Solution] This image analysis device, which extracts voids from a 3D image of a fiber-reinforced composite material, is characterized by the provision of a processor that performs image processing on said 3D image by: binarizing the 3D image, yielding a binary image; performing a distance transform on said binary image, yielding a distance image; using said distance image to perform a closing process on the binary image; extracting voids from the difference between the images before and after the closing process; classifying voids that are adjacent to background voxels as open voids; classifying voids that are not adjacent to background voxels as closed voids; and performing an opening process on open voids so as to remove false voids.
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Inventors:
HISHIDA HIROYUKI (JP)
INAGAKI KOICHI (JP)
NAKAMURA TAKESHI (JP)
MICHIKAWA TAKASHI (JP)
SUZUKI HIROMASA (JP)
INAGAKI KOICHI (JP)
NAKAMURA TAKESHI (JP)
MICHIKAWA TAKASHI (JP)
SUZUKI HIROMASA (JP)
Application Number:
PCT/JP2014/075945
Publication Date:
April 02, 2015
Filing Date:
September 29, 2014
Export Citation:
Assignee:
IHI CORP (JP)
UNIV TOKYO (JP)
UNIV TOKYO (JP)
International Classes:
G01N23/04; G06T1/00
Foreign References:
| JP2009198463A | 2009-09-03 | |||
| JP2010261933A | 2010-11-18 | |||
| JP2009198463A | 2009-09-03 |
Other References:
MAKOTO ANDO: "X Sen CT no Genri to Katsuyo", IDEMITSU TECHNICAL REPORT, vol. 52, no. 2, 15 June 2009 (2009-06-15), pages 191 - 196, XP008183392
See also references of EP 3054287A4
See also references of EP 3054287A4
Attorney, Agent or Firm:
OHGA, Shinji et al. (JP)
Heartly congratulation Shinji (JP)
Heartly congratulation Shinji (JP)
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