IMAGE ANALYSIS SYSTEM - MITSUBISHI ELECTRIC BUILDING SOLUTIONS CORP

Title:

IMAGE ANALYSIS SYSTEM

Document Type and Number:

WIPO Patent Application WO/2023/067704

Kind Code:

A1

Abstract:

Provided is an image analysis system with which it is possible to assess a region in which abnormality has occurred in a photographic image photographed by a camera. This image analysis system (1) comprises an image acquisition unit (24) and an abnormality assessment unit (32). The image acquisition unit (24) acquires a photographic image from a camera (17) for photographing the photographic range of lifting equipment. When a photographic image that was photographed while an illumination control unit (29) was changing the illumination of an illumination device (18) positioned facing the photographic range includes a region in which the change amount of the photographic image is smaller than a first threshold value, the abnormality assessment unit (32) assesses that said region is abnormal. Alternatively, when a photographic image that was acquired by the image acquisition unit (24) and photographed during an assessment period includes a region in which the change amount of the photographic image throughout the assessment period is smaller than a second threshold value, said region being present within a change region selected as having a visible change due to the operation of the lifting equipment, the abnormality assessment unit (32) assesses that said region is abnormal.

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Inventors:

MURAKAMI HIROYUKI (JP)

Application Number:

PCT/JP2021/038642

Publication Date:

April 27, 2023

Filing Date:

October 19, 2021

Export Citation:

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Assignee:

MITSUBISHI ELECTRIC BUILDING SOLUTIONS CORP (JP)

International Classes:

H04N17/00; H04N7/18

Foreign References:

JPH07250317A	1995-09-26
JP2019029940A	2019-02-21
US20190273887A1	2019-09-05
JP2010016892A	2010-01-21
JP2017216518A	2017-12-07
JP2007159021A	2007-06-21
JP2001268552A	2001-09-28

Attorney, Agent or Firm:

TAKADA, TAKAHASHI & PARTNERS (JP)

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