Title:
IMAGE DIAGNOSTIC ASSISTANCE DEVICE, IMAGE DIAGNOSTIC ASSISTANCE METHOD, AND SAMPLE ANALYSIS SYSTEM
Document Type and Number:
WIPO Patent Application WO/2018/051777
Kind Code:
A1
Abstract:
By computing respective reaction values, which indicate which regions within an inputted image have provided the basis for determinations which have been made for a plurality of identification results which represent states of cells or tissues, and deriving differences among the plurality of said reaction values, each state likelihood of the cells or tissues within a region of interest is computed. It is thus possible to visualize each state of the cells or tissues at precise positions within the region of interest, thereby facilitating assisting a diagnosis by a pathologist.
Inventors:
KAKISHITA YASUKI (JP)
HATTORI HIDEHARU (JP)
UCHIDA KENKO (JP)
ASO SADAMITSU (JP)
SAKURAI TOSHINARI (JP)
HATTORI HIDEHARU (JP)
UCHIDA KENKO (JP)
ASO SADAMITSU (JP)
SAKURAI TOSHINARI (JP)
Application Number:
PCT/JP2017/030817
Publication Date:
March 22, 2018
Filing Date:
August 28, 2017
Export Citation:
Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G06T7/00; G01N21/27; G06T1/00
Domestic Patent References:
| WO2011129176A1 | 2011-10-20 |
Foreign References:
| JP2012008027A | 2012-01-12 | |||
| JP2011095921A | 2011-05-12 |
Other References:
See also references of EP 3514755A4
Attorney, Agent or Firm:
SUNNEXT INTERNATIONAL PATENT OFFICE (JP)
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