Title:
IMAGE GENERATION DEVICE, DEFECT INSPECTION DEVICE, AND DEFECT INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2014/112653
Kind Code:
A1
Abstract:
A defect inspection device (100) is provided with: a transport unit (11) that transports a sheet-like molded body; a light irradiation unit (12) that irradiates light on the sheet-like molded body; an imaging unit (13) that generates two-dimensional image data by means of an imaging operation; a boundary extraction unit (1411) that extracts boundary line parts between light and dark parts in two-dimensional images represented by the two-dimensional image data; a re-extraction unit (1412) that connects the boundary line parts extracted by the boundary extraction unit (1411) to form apparent boundary lines, smooths the apparent boundary lines in such a manner that sharp peaks appearing on the apparent boundary lines disappear, and extracts, from the two-dimensional image data, pixels constituting intrinsic boundary lines obtained by smoothing; and a synthesizing unit (1413) that generates one-dimensional image data comprising the pixels extracted by the re-extraction unit (1412), and generates inspection image data by synthesizing a plurality of one-dimensional image data obtained from a plurality of two-dimensional image data.
Inventors:
OZAKI MAYA (JP)
Application Number:
PCT/JP2014/051160
Publication Date:
July 24, 2014
Filing Date:
January 15, 2014
Export Citation:
Assignee:
SUMITOMO CHEMICAL CO (JP)
International Classes:
G01N21/892; G06T1/00
Domestic Patent References:
| WO2010058557A1 | 2010-05-27 |
Foreign References:
| JP2004184397A | 2004-07-02 | |||
| JPH10260027A | 1998-09-29 | |||
| JPH09126744A | 1997-05-16 |
Attorney, Agent or Firm:
NAKAYAMA, Tohru et al. (JP)
Nakayama δΊ¨ (JP)
Nakayama δΊ¨ (JP)
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