Title:
IMAGE INSPECTION DEVICE, IMAGE INSPECTION METHOD, AND IMAGE INSPECTION DEVICE COMPONENT
Document Type and Number:
WIPO Patent Application WO/2018/034181
Kind Code:
A1
Abstract:
An image inspection device provided with: a mounting unit 10 having mounted thereon an image projection device 30 for directly projecting an image onto a user's retina; a condensing lens 12 for condensing a light beam 50 output from the image projection device 30 mounted on the mounting unit 10; a part 14 on which an image is to be projected, the part 14 being irradiated with the light beam condensed by the condensing lens 12 such that an inspection image is projected thereon; and an inspection unit 22 for inspecting the inspection image projected on the part 14 on which an image is projected.
Inventors:
MORINO SEIJI (JP)
SUZUKI MAKOTO (JP)
ISHIMOTO MANABU (JP)
SUZUKI MAKOTO (JP)
ISHIMOTO MANABU (JP)
Application Number:
PCT/JP2017/028558
Publication Date:
February 22, 2018
Filing Date:
August 07, 2017
Export Citation:
Assignee:
QD LASER INC (JP)
International Classes:
G01M11/00; A61B3/10; G01B11/02; G02B17/00; G02B27/02; H04N5/64
Domestic Patent References:
| WO2008149712A1 | 2008-12-11 |
Foreign References:
| US20130258486A1 | 2013-10-03 | |||
| JP2003279446A | 2003-10-02 | |||
| JP2010522347A | 2010-07-01 | |||
| JP2009156992A | 2009-07-16 | |||
| US20060232665A1 | 2006-10-19 | |||
| US5889625A | 1999-03-30 |
Other References:
See also references of EP 3502647A4
Attorney, Agent or Firm:
KATAYAMA, Shuhei (JP)
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