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Patent Searching and Data


Title:
IMAGE INSPECTION METHOD AND INSPECTION REGION SETTING METHOD
Document Type and Number:
WIPO Patent Application WO/2013/136591
Kind Code:
A1
Abstract:
An image inspection device according to the present invention uses inspection region definition information including: information for defining an initial outline of an inspection region; and another information for defining which part of the outline of the inspection region should be searched as a search range with reference to the initial outline. An outline of the inspection region is then generated in such a way that: a plurality of base points are set on the initial outline; in a region inside the search range, an edge searching process is performed on a line segment passing through each of the base points and intersecting to the initial outline, thereby determining an edge point corresponding to each of the base points; and the obtained edge points are connected to each other or approximated.

Inventors:
KOTAKE YASUYO (JP)
MINATO YOSHIHISA (JP)
YANAGAWA YUKIKO (JP)
NGUYEN ANH (JP)
Application Number:
PCT/JP2012/079831
Publication Date:
September 19, 2013
Filing Date:
November 16, 2012
Export Citation:
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Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G01B11/00; G01N21/84; G01N21/956; G06T7/60; H05K3/34; H05K13/08
Foreign References:
JP2000163579A2000-06-16
JPH1183435A1999-03-26
JPH028705A1990-01-12
JPH07260701A1995-10-13
JP2003016463A2003-01-17
JP2010027964A2010-02-04
Other References:
T. F. COOTES; C. J. TAYLOR; D. H. COOPER ET AL.: "Active Shape Models - Their Training and Application", COMPUTER VISION AND IMAGE UNDERSTANDING, vol. 61, no. 1, January 1995 (1995-01-01), pages 38 - 59
Attorney, Agent or Firm:
SERA Kazunobu et al. (JP)
Kazunobu Sera (JP)
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