Title:
IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD, APPEARANCE INSPECTION SYSTEM, AND APPEARANCE INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2019/194064
Kind Code:
A1
Abstract:
[Problem] To provide a novel image processing device, appearance inspection system, and computer program that can be used for appearance inspection. [Solution] This image processing device (10) comprises a processor (10) and memory (12) that stores a program that controls the activity of the processor. The processor: acquires data for an image that includes an inspection region of an inspection target; acquires, from the data for the image, pixel values for pixel locations within the inspection region; acquires statistics from a learned quality product database, the statistics having been determined on the basis of data for images that include reference regions of a plurality of respective quality products and having been defined by the average and standard deviation of pixel values for pixel locations within the reference regions; compares pixel values with the statistics and classifies pixels as either quality product pixels or defect pixels; determines whether the inspection target is a quality product on the basis of the arrangement of pixels that have been classified as defect pixels; and, when a user has made a request, updates the statistics using pixel values for pixel locations within a partial region of a reference region of a quality product that is not among the plurality of quality products.
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Inventors:
TAIMATSU MICHIHITO (JP)
HARA TAKUYA (JP)
YAMADA EIJI (JP)
HARA TAKUYA (JP)
YAMADA EIJI (JP)
Application Number:
PCT/JP2019/013557
Publication Date:
October 10, 2019
Filing Date:
March 28, 2019
Export Citation:
Assignee:
NIDEC CORP (JP)
International Classes:
G01N21/88; G06T7/00
Domestic Patent References:
WO2005006002A2 | 2005-01-20 | |||
WO2017179243A1 | 2017-10-19 | |||
WO2018225745A1 | 2018-12-13 |
Foreign References:
JP2013142558A | 2013-07-22 | |||
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