Title:
IMAGING CONTROL DEVICE, IMAGING DEVICE, IMAGING CONTROL METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2022/209272
Kind Code:
A1
Abstract:
An imaging control device characterized by comprising: a first acquisition unit that acquires optical system incline information indicating the incline of an optical system of an imaging device; a second acquisition unit that acquires workpiece incline information indicating the incline of a workpiece to be imaged by the imaging device; and a control unit that controls the incline of the optical system or the incline of the workpiece on the basis of the optical system incline information acquired by the first acquisition unit and the workpiece incline information acquired by the second acquisition unit.
Inventors:
ISHIKAWA HIROKAZU (JP)
Application Number:
PCT/JP2022/004196
Publication Date:
October 06, 2022
Filing Date:
February 03, 2022
Export Citation:
Assignee:
NIDEC CORP (JP)
International Classes:
H04N5/232; G03B15/00; G03B17/00
Foreign References:
| JP2011507714A | 2011-03-10 | |||
| JP2009241247A | 2009-10-22 | |||
| JP2021016910A | 2021-02-15 | |||
| US20170177005A1 | 2017-06-22 |
Download PDF:
Previous Patent: MEASUREMENT DEVICE, MEASUREMENT METHOD, AND MEASUREMENT PROGRAM
Next Patent: VACUUM MULTILAYERED GLASS PANEL
Next Patent: VACUUM MULTILAYERED GLASS PANEL