Title:
IMAGING DEVICE AND CALIBRATION METHOD
Document Type and Number:
WIPO Patent Application WO/2019/151065
Kind Code:
A1
Abstract:
To obtain an imaging device that can improve temperature detection accuracy. An imaging device of the present disclosure includes a processing unit formed on a first semiconductor substrate and capable of performing predetermined image processing on the basis of image data obtained by an imaging unit, a temperature sensor formed on the first semiconductor substrate and capable of generating a detection signal according to a temperature, and a first pad electrode formed on the first semiconductor substrate and electrically insulated from a circuit formed on the first semiconductor substrate.
Inventors:
KAWAZU NAOKI (JP)
SASAKI KEITA (JP)
OKA TAKUMI (JP)
HAQUE MOHAMMAD MUNIR (US)
FUJIMORI NOBUHIKO (JP)
SATOU MAKOTO (JP)
BABA MASAHIRO (JP)
YAMAMOTO SATOSHI (JP)
MOTOHASHI YUICHI (JP)
SUZUKI ATSUSHI (JP)
SASAKI KEITA (JP)
OKA TAKUMI (JP)
HAQUE MOHAMMAD MUNIR (US)
FUJIMORI NOBUHIKO (JP)
SATOU MAKOTO (JP)
BABA MASAHIRO (JP)
YAMAMOTO SATOSHI (JP)
MOTOHASHI YUICHI (JP)
SUZUKI ATSUSHI (JP)
Application Number:
PCT/JP2019/001986
Publication Date:
August 08, 2019
Filing Date:
January 23, 2019
Export Citation:
Assignee:
SONY SEMICONDUCTOR SOLUTIONS CORP (JP)
International Classes:
H04N5/378; G01K7/01; H04N5/369
Domestic Patent References:
| WO2011132393A1 | 2011-10-27 |
Foreign References:
| US20170339360A1 | 2017-11-23 | |||
| JP2001298160A | 2001-10-26 | |||
| US20120182450A1 | 2012-07-19 | |||
| JP2012220437A | 2012-11-12 |
Attorney, Agent or Firm:
TSUBASA PATENT PROFESSIONAL CORPORATION (JP)
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