Title:
IMAGING PANEL AND X-RAY IMAGING SYSTEM PROVIDED WITH SAID IMAGING PANEL
Document Type and Number:
WIPO Patent Application WO/2016/002610
Kind Code:
A1
Abstract:
This invention increases the efficiency with which a photoelectric conversion element converts scintillation light to electric charge in an imaging panel used in an indirect-conversion X-ray imaging system. Said imaging panel (12), which generates an image on the basis of scintillation light obtained from X-rays that have passed through a subject (18), is provided with a substrate (20), a thin-film transistor (24), the aforementioned photoelectric conversion element (26), and a reflective layer. The thin-film transistor is formed on the substrate. The photoelectric conversion element is connected to the thin-film transistor and converts incident scintillation light to electric charge. Seen from the direction from which said scintillation light is incident, the reflective layer overlaps the entire region of a light-receiving surface (261) of the photoelectric conversion element on which the scintillation light is incident. The reflective layer may be a drain electrode (36). Alternatively, the reflective layer may be a reflective electrode (52) formed in the same layer as a gate electrode (28).
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Inventors:
MORI SHIGEYASU
TOMIYASU KAZUHIDE
TOMIYASU KAZUHIDE
Application Number:
PCT/JP2015/068303
Publication Date:
January 07, 2016
Filing Date:
June 25, 2015
Export Citation:
Assignee:
SHARP KK (JP)
International Classes:
H01L27/146; A61B6/00; G01T1/20; H01L27/144; H01L31/10; H04N5/32; H04N5/369
Domestic Patent References:
| WO2013130038A1 | 2013-09-06 |
Foreign References:
| JP2009059975A | 2009-03-19 | |||
| JP2010098329A | 2010-04-30 | |||
| JP2013016772A | 2013-01-24 | |||
| JP2010225735A | 2010-10-07 | |||
| JP2007103578A | 2007-04-19 | |||
| US20070272872A1 | 2007-11-29 | |||
| JP2009130127A | 2009-06-11 |
Attorney, Agent or Firm:
KAWAKAMI Keiko et al. (JP)
Keiko Kawakami (JP)
Keiko Kawakami (JP)
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