Title:
IMAGING PANEL AND X-RAY IMAGING SYSTEM PROVIDED WITH SAID IMAGING PANEL
Document Type and Number:
WIPO Patent Application WO/2016/002612
Kind Code:
A1
Abstract:
This invention makes stable operation of a thin-film transistor in an imaging panel used in an indirect-conversion X-ray imaging system possible. Said imaging panel (12) is provided with a substrate (20), the aforementioned thin-film transistor (24), a photoelectric conversion element (26), and a biasing wire (46). The thin-film transistor is formed on the substrate. The photoelectric conversion element is connected to the thin-film transistor and is exposed to scintillation light. The biasing wire is connected to the photoelectric conversion element and applies, to the photoelectric conversion element, a voltage that reverse-biases same. The thin-film transistor is provided with a semiconductor active layer (32) and a gate electrode (28). Said gate electrode is formed between the abovementioned substrate and the semiconductor active layer. Seen from the direction from which the scintillation light is incident, the biasing wire has a section that overlaps the gate electrode and the semiconductor active layer.
Inventors:
MORI SHIGEYASU
TOMIYASU KAZUHIDE
TOMIYASU KAZUHIDE
Application Number:
PCT/JP2015/068305
Publication Date:
January 07, 2016
Filing Date:
June 25, 2015
Export Citation:
Assignee:
SHARP KK (JP)
International Classes:
H01L27/144; A61B6/00; G01T1/20; H01L27/146; H01L31/10; H04N5/32; H04N5/369
Domestic Patent References:
| WO2013130038A1 | 2013-09-06 |
Foreign References:
| JP2009059975A | 2009-03-19 | |||
| JP2013219067A | 2013-10-24 | |||
| JP2013016772A | 2013-01-24 | |||
| JP2010225735A | 2010-10-07 | |||
| JP2009130127A | 2009-06-11 |
Attorney, Agent or Firm:
KAWAKAMI Keiko et al. (JP)
Keiko Kawakami (JP)
Keiko Kawakami (JP)
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