Title:
IMPACT DETERMINATION SYSTEM, IMPACT DETERMINATION METHOD, AND RECORDING MEDIUM
Document Type and Number:
WIPO Patent Application WO/2023/162245
Kind Code:
A1
Abstract:
An impact determination system of the present invention, which more appropriately determines the impact of an event on a structure, comprises: a predicted state acquisition means for acquiring a predicted surface state of the structure after the event, the predicted surface state being sensor information associated with the surface of the structure on the ground surface and predicted on the basis of pre-event sensor information measured prior to the event associated with the ground for the structure; a sensor information acquisition means for acquiring post-event sensor information measured after the event; a state determination means for determining a post-event surface state of the structure on the basis of the post-event sensor information; and an impact determination means for determining the impact of the event on the structure on the basis of the predicted surface state and the post-event surface state.
Inventors:
SUGAWARA CHISATO (JP)
YOKOTE TOSHIMICHI (JP)
KIMURA YOSUKE (JP)
MIZUKOSHI YUSUKE (JP)
ISHII TAKAKAZU (JP)
HIRATA HIROMICHI (JP)
OHNO SHOUHEI (JP)
JUMONJI NANA (JP)
YOKOTE TOSHIMICHI (JP)
KIMURA YOSUKE (JP)
MIZUKOSHI YUSUKE (JP)
ISHII TAKAKAZU (JP)
HIRATA HIROMICHI (JP)
OHNO SHOUHEI (JP)
JUMONJI NANA (JP)
Application Number:
PCT/JP2022/008354
Publication Date:
August 31, 2023
Filing Date:
February 28, 2022
Export Citation:
Assignee:
NEC CORP (JP)
International Classes:
G01B21/32; G01C15/00; G01S13/90
Domestic Patent References:
| WO2021199241A1 | 2021-10-07 |
Foreign References:
| JP2020159023A | 2020-10-01 | |||
| JP2019132707A | 2019-08-08 | |||
| JP2017101992A | 2017-06-08 | |||
| JP2020020740A | 2020-02-06 | |||
| JP2020070101A | 2020-05-07 |
Attorney, Agent or Firm:
KITAJIMA Hiroshi et al. (JP)
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