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Patent Searching and Data


Title:
IMPACT POINT ANALYSIS SYSTEM, IMPACT POINT ANALYSIS METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2024/048780
Kind Code:
A1
Abstract:
This impact point analysis system comprises: a detecting unit for detecting that an inspector has impacted an inspection target using a hammer; a processing unit 26 for processing a result of the detection to identify position information relating to a position of an impact point impacted by the hammer in a coordinate plane including the inspection target; and a generating unit 27 for calculating distribution information relating to a distribution of the impact points on the coordinate plane, on the basis of the position information, and generating impact point data including the position information and the distribution information. By processing the detection results of the impact inspection performed by the inspector, identifying the position information relating to the positions of the impact points impacted by the hammer, calculating the distribution information relating to the distribution of the impact points on the basis of the position information, and generating the impact point data including the position information and the distribution information, it is possible to know a range in which the inspector has intensively impacted the inspection target using the hammer during the impact inspection, and to know how to narrow down a range to be intensively impacted.

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Inventors:
WADA SATOSHI (JP)
MICHIKAWA TAKASHI (JP)
SASSA TAKAFUMI (JP)
KUNIMOTO YUKINORI (JP)
Application Number:
PCT/JP2023/032090
Publication Date:
March 07, 2024
Filing Date:
September 01, 2023
Export Citation:
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Assignee:
RIKEN (JP)
International Classes:
G01N29/04; G01N29/12
Foreign References:
JP2017198508A2017-11-02
JP2014134471A2014-07-24
Attorney, Agent or Firm:
RYUKA & PARTNERS (JP)
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