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Title:
IMPEDANCE MEASUREMENT SYSTEM, IMPEDANCE MEASUREMENT METHOD AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2012/124359
Kind Code:
A1
Abstract:
A condition input device inputs measurement conditions and information about an electronic device to be measured. A measurement operation program device selects a program for performing measurement operations on the electronic device according to the information to be measured and the measurement conditions. A voltage measurement device measures voltage fluctuations produced in a power source from the electronic device. A waveform arithmetic device carries out arithmetic processing such as filter processing, and time-frequency conversion (for example, the Fourier Transform) on the measured voltage fluctuations, and obtains the frequency characteristics of the voltage fluctuations. An impedance calculation device calculates impedance from the frequency characteristics of the voltage fluctuations, the frequency characteristics of the current, and the measurement operation program conditions.

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Inventors:
KUSUMOTO MANABU (JP)
KAWAKAMI MASASHI (JP)
Application Number:
PCT/JP2012/050445
Publication Date:
September 20, 2012
Filing Date:
January 12, 2012
Export Citation:
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Assignee:
NEC CORP (JP)
KUSUMOTO MANABU (JP)
KAWAKAMI MASASHI (JP)
International Classes:
G01R27/02
Foreign References:
JPS63108284A1988-05-13
JPH06347517A1994-12-22
JPH0787007A1995-03-31
JP2007265895A2007-10-11
JP2009292282A2009-12-17
Attorney, Agent or Firm:
TANAI Sumio et al. (JP)
Sumio Tanai (JP)
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