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Patent Searching and Data


Title:
IMPEDANCE MEASUREMENT SYSTEM AND IMPEDANCE MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2024/085158
Kind Code:
A1
Abstract:
An impedance measurement system 1 according to the present invention has an impedance measurement device 5 that includes a measurement signal generation source 11, a current detection unit 13, and a voltage detection unit 15, and that measures the impedance of measurement object electronic components 21, 22. A switch 30, for connecting a current measurement line 54 between the measurement signal generation source 11 and the measurement object electronic component 22 and a current measurement line 46 between one of output terminals of the current detection unit 13 and the measurement object electronic component 21 is provided. The impedance measurement system 1 according to the present invention can improve safety during measurement.

Inventors:
IGAI RYOSUKE (JP)
IIJIMA JUNJI (JP)
NARUSAWA CHIHIRO (JP)
Application Number:
PCT/JP2023/037592
Publication Date:
April 25, 2024
Filing Date:
October 17, 2023
Export Citation:
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Assignee:
HIOKI E E CORP (JP)
International Classes:
G01R27/02; G01R31/389
Attorney, Agent or Firm:
MEBUKI IP LAW FIRM (JP)
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