Title:
IMPEDANCE MEASUREMENT SYSTEM
Document Type and Number:
WIPO Patent Application WO/2023/277178
Kind Code:
A1
Abstract:
The present invention provides an impedance measurement system that makes it possible to improve accuracy in impedance measurement. An impedance measurement system 1 comprises: a master-side measuring instrument 10 that supplies a measurement alternating current i1 to one measurement object and measures impedance; and a slave-side measuring instrument 20 that measures the impedance of an other measurement object. The master-side measuring instrument 10 has a constant current source 11 that supplies a measurement alternating current, and a voltage detection unit 13 that detects the voltage of said one measurement object and outputs the impedance of a sample. The slave-side measuring instrument 20 is caused to carry out synchronous detection in the same phase as the measurement alternating current, and the impedance of said other measurement object is calculated on the basis of a measurement alternating current i1 from the constant current source 11 and the voltage that has been detected by a slave-side voltmeter 23 which constitutes the slave-side measuring instrument 20.
Inventors:
IIJIMA JUNJI (JP)
Application Number:
PCT/JP2022/026460
Publication Date:
January 05, 2023
Filing Date:
July 01, 2022
Export Citation:
Assignee:
HIOKI ELECTRIC WORKS (JP)
International Classes:
G01R27/02; G01R31/389
Domestic Patent References:
| WO2018078790A1 | 2018-05-03 |
Foreign References:
| JP2020186946A | 2020-11-19 | |||
| JP2019086474A | 2019-06-06 | |||
| JP2017203726A | 2017-11-16 | |||
| US20080303528A1 | 2008-12-11 | |||
| JP3217195U | 2018-07-26 | |||
| JP2017173012A | 2017-09-28 |
Attorney, Agent or Firm:
IAT WORLD PATENT LAW FIRM (JP)
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