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Patent Searching and Data


Title:
IMPEDANCE TEST PROBE AND PCB IMPEDANCE TEST MACHINE
Document Type and Number:
WIPO Patent Application WO/2019/062207
Kind Code:
A1
Abstract:
An impedance test probe, comprising: at least two probe pins (1, 2) and a probe pin short-circuiting device (3). The probe pin short-circuiting device (3) is an elastic short-circuiting device. One end of the probe pin short-circuiting device (3) is fixedly connected to the tip of one of the probe pins (1, 2), and the other end may contact and be connected to the tip of any one of the remaining probe pins (1, 2). The short-circuiting connection between the probe pins (1, 2) is a flexible connection, and can make the spacing and angle between the tips of the probe pins (1, 2) for high-frequency impedance tests adjustable, so that the costs of a probe pin group are reduced and the working efficiency and test precision are improved. In addition, automatic production of the impedance tests is made possible.

Inventors:
SONG WEIHUA (CN)
YE ZONGSHUN (CN)
Application Number:
PCT/CN2018/090921
Publication Date:
April 04, 2019
Filing Date:
June 13, 2018
Export Citation:
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Assignee:
JOINT STARS TECH CO LTD (CN)
International Classes:
G01R27/02; G01R1/073
Foreign References:
CN107589301A2018-01-16
CN207301176U2018-05-01
CN205898898U2017-01-18
CN204758649U2015-11-11
CN101581742A2009-11-18
CN205643633U2016-10-12
CN101501509A2009-08-05
US7626408B12009-12-01
Attorney, Agent or Firm:
NANJING RUIHONG PATENT & TRADEMARK AGENCY (ORDINARY PARTNERSHIP) (CN)
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