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Patent Searching and Data


Title:
IMPURITY DETECTION DEVICE, IMPURITY DETECTION METHOD, AND COMPUTER PROGRAM
Document Type and Number:
WIPO Patent Application WO/2021/038811
Kind Code:
A1
Abstract:
This impurity detection device is for detecting impurities intermingled in a fluid material, and is provided with: a real-temperature acquisition unit for acquiring a real temperature of the fluid material as measured by a temperature sensor; a temperature distribution acquisition unit for acquiring a temperature distribution image that shows the influence of emissivity on the surface of the fluid material photographed by an infrared imaging device; and a determination unit for determining, on the basis of the difference between the temperature of the fluid material in the temperature distribution image and the real temperature, whether or not impurities are intermingled in the fluid material in an amount exceeding a predetermined amount.

Inventors:
ASAKA RYUJI (JP)
Application Number:
PCT/JP2019/034007
Publication Date:
March 04, 2021
Filing Date:
August 29, 2019
Export Citation:
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Assignee:
MACNICA INC (JP)
International Classes:
G01N25/72
Foreign References:
JP2019105389A2019-06-27
JP2017150034A2017-08-31
JP2003315156A2003-11-06
US20180356346A12018-12-13
Attorney, Agent or Firm:
AOKI, Atsushi et al. (JP)
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