Title:
INDENTATION TEST DEVICE
Document Type and Number:
WIPO Patent Application WO/2017/164426
Kind Code:
A2
Abstract:
This indentation test device has an elongated pencil shape, and is equipped with: a load detection sensor 30; a control board 40 to which a circuit is provided for processing measurement data from the load detection sensor; an annular sample contacting portion 1011 that is provided to one end of a casing and comes into contact with a sample; an indenter 51 that has a spherical contact surface which comes into contact with the sample, and that is coupled to a movable portion 34 of the load detection sensor 30 in a state in which the spherical contact surface is protruding a certain amount from the sample contacting portion of the casing; and an overload stopper 531 that limits the retraction amount of the indenter 51 for retracting to within the casing when the spherical contact surface receives a repelling force from the sample. The spherical contact surface of the indenter 51 is pushed against the sample until the sample contacting portion 1011 comes into contact with the sample, and the indentation load is measured by the load detection sensor 30.
Inventors:
OKAMOTO KOHEI (JP)
KIMURA SHINJI (JP)
KOMINE TAKAHIRO (JP)
FUJIHARA KAZUSHI (JP)
YABE YOJI (JP)
YASUHARA KAZUYOSHI (JP)
KIMURA SHINJI (JP)
KOMINE TAKAHIRO (JP)
FUJIHARA KAZUSHI (JP)
YABE YOJI (JP)
YASUHARA KAZUYOSHI (JP)
Application Number:
PCT/JP2017/022426
Publication Date:
September 28, 2017
Filing Date:
June 17, 2017
Export Citation:
Assignee:
SHINKO DENSHI KK (JP)
International Classes:
G01N3/40
Attorney, Agent or Firm:
OHASHI Koji (JP)
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