Title:
INDENTER TRANSMISSION TYPE SPECIMEN SURFACE OBSERVATION DEVICE AND OBSERVATION METHOD, AND PROGRAM FOR MOVING IMAGE ANALYSIS/DEVICE CONTROL/CHARACTERISTIC VALUE CALCULATION
Document Type and Number:
WIPO Patent Application WO/2017/138582
Kind Code:
A1
Abstract:
This observation device is used to observe the surface of a specimen when a load is applied to said surface, using a transparent indenter which transmits light of a specific wavelength. The observation device is characterized in including: a pressurizing means for applying a load to the specimen; a load measuring means for measuring the load; and an image capturing means for capturing an image of the surface of the specimen to which the load is being applied by the pressurizing means; wherein the image capturing means captures an image of the specimen through the transparent indenter, the observation is an observation of the shape of the surface, of twinning, or of dislocation and/or cracking, for example, a liquid is present in a gap between the transparent indenter and the surface of the specimen, and the refractive indexes of the transparent indenter and the liquid are substantially equal when measured at 25±5ºC using light of a prescribed wavelength. As a result, it is possible to provide a technology for observing the surface of a specimen, with which, when observing the surface of the specimen during a loading and unloading process of an indentation test, for example, the occurrence of refraction at an interface between the indenter and the specimen is suppressed.
Inventors:
MIYAJIMA TATSUYA (JP)
MIURA SEIJI (JP)
MINETA TAKAHIRO (JP)
MIURA SEIJI (JP)
MINETA TAKAHIRO (JP)
Application Number:
PCT/JP2017/004644
Publication Date:
August 17, 2017
Filing Date:
February 08, 2017
Export Citation:
Assignee:
NAT INST ADVANCED IND SCIENCE & TECH (JP)
International Classes:
G01N3/42
Foreign References:
| JP2005195357A | 2005-07-21 | |||
| JP2014070932A | 2014-04-21 | |||
| JP2006171186A | 2006-06-29 |
Other References:
HAKIRI NORIO ET AL: "Development of Instrumented Indentation Microscope and its Application to Indentation Contact Mechanics", JOURNAL OF THE SOCIETY OF MATERIALS SCIENCE, vol. 56, no. 6, 1 June 2007 (2007-06-01), pages 510 - 515, XP055600065
Attorney, Agent or Firm:
NISHIZAWA Toshio (JP)
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