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Patent Searching and Data


Title:
INDEPENDENTLY DRIVEN INDENTATION TESTING DEVICE
Document Type and Number:
WIPO Patent Application WO/2011/062406
Kind Code:
A2
Abstract:
The present invention relates to an indentation testing device, and more specifically to an independently driven indentation testing device which can induce local indentation deformation by using the restoring force of materials subjected to resilient deformation or drop loading in an extreme environment such as high-temperature, extremely low-temperature and explosive energy fluids.

Inventors:
LEE YUN HEE (KR)
PARK JONG SEO (KR)
NAHM SEUNG HOON (KR)
LEE HAE MOO (KR)
Application Number:
PCT/KR2010/008093
Publication Date:
May 26, 2011
Filing Date:
November 16, 2010
Export Citation:
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Assignee:
KOREA RES INST OF STANDARDS (KR)
LEE YUN HEE (KR)
PARK JONG SEO (KR)
NAHM SEUNG HOON (KR)
LEE HAE MOO (KR)
International Classes:
G01M7/08; G01M7/00
Foreign References:
JPS6066132A1985-04-16
JPS6361136A1988-03-17
US4646571A1987-03-03
JP2004317217A2004-11-11
JP2004012424A2004-01-15
Attorney, Agent or Firm:
KWON, Oh-Sig et al. (KR)
권오식 (KR)
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